GB/T 24578-2024 Chinese PDF (GB/T24578-2024)GB T 24578 2024_Chinese: Test method for measuring surface metal contamination on semiconductor wafers Total reflection X Ray fluorescence spectroscopy (Chinese: X) Note Careful: Text of PDF is in Chinese (not English). Delivery (PDF in Chinese): 2 working hours typically, ASAP English versions: GB T 24578 2024
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